Defect and Impurity Distributions in Traditionally Cast Multicrystalline and Cast Monocrystalline Silicon for Solar Substrates
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Date
2008-08-26
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Keywords
MW-PCD, impurities, DLTS, crystal defects, FT-IR, monocrystalline cast silicon, defect delineation etching, SIMS, solar silicon, Mono2, multicrystalline cast silicon
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Degree
MS
Discipline
Materials Science and Engineering
