Resistivity and Defect-induced Lifetime Variations in Gallium-doped Continuous Czochralski Grown Silicon.

Simple item page
dc.contributor.advisorGeorge Rozgonyi, Chairen_US
dc.contributor.advisorMehmet Ozturk, Minoren_US
dc.contributor.advisorLinyou Cao, Memberen_US
dc.contributor.authorYan, Yixinen_US
dc.date.accepted2012-06-15en_US
dc.date.accessioned2012-06-18T05:31:07Z
dc.date.available2012-06-18T05:31:07Z
dc.date.defense2012-06-08en_US
dc.date.issued2012-06-08en_US
dc.date.released2012-06-18en_US
dc.date.reviewed2012-06-12en_US
dc.date.submitted2012-06-11en_US
dc.degree.disciplineMaterials Science and Engineeringen_US
dc.degree.levelthesisen_US
dc.degree.nameMaster of Scienceen_US
dc.identifier.otherdeg1848en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/7826
dc.titleResistivity and Defect-induced Lifetime Variations in Gallium-doped Continuous Czochralski Grown Silicon.en_US

Files

Original bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
etd.pdf
Size:
1.43 MB
Format:
Adobe Portable Document Format
Download

Collections

Theses