The Impact of Metallic Impurities on Minority Carrier Lifetime in High Purity n-type Silicon.

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dc.contributor.advisorGeorge Rozgonyi, Chairen_US
dc.contributor.advisorJerome Cuomo, Memberen_US
dc.contributor.advisorMehmet Ozturk, Memberen_US
dc.contributor.advisorLinyou Cao, Memberen_US
dc.contributor.authorYoon, Yo Hanen_US
dc.date.accepted2012-11-26en_US
dc.date.accessioned2012-12-01T06:31:26Z
dc.date.available2012-12-01T06:31:26Z
dc.date.defense2012-10-30en_US
dc.date.issued2012-10-30en_US
dc.date.released2012-12-01en_US
dc.date.reviewed2012-11-06en_US
dc.date.submitted2012-11-01en_US
dc.degree.disciplineMaterials Science and Engineeringen_US
dc.degree.leveldissertationen_US
dc.degree.nameDoctor of Philosophyen_US
dc.identifier.otherdeg2162en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/8251
dc.titleThe Impact of Metallic Impurities on Minority Carrier Lifetime in High Purity n-type Silicon.en_US

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