Variability and Reliability in Nanoscale Circuits: Simulation, Design, Monitoring, and Characterization.

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dc.contributor.advisorMichael Steer, Chairen_US
dc.contributor.advisorPaul Franzon, Co-Chairen_US
dc.contributor.advisorMo-Yuen Chow, Memberen_US
dc.contributor.advisorJoseph Tracy, Minoren_US
dc.contributor.authorYelten, Mustafaen_US
dc.date.accepted2011-08-08en_US
dc.date.accessioned2011-11-15T06:31:42Z
dc.date.available2011-11-15T06:31:42Z
dc.date.defense2011-08-02en_US
dc.date.issued2011-08-02en_US
dc.date.released2011-11-15en_US
dc.date.reviewed2011-08-03en_US
dc.date.submitted2011-08-02en_US
dc.degree.disciplineElectrical Engineeringen_US
dc.degree.leveldissertationen_US
dc.degree.nameDoctor of Philosophyen_US
dc.identifier.otherdeg1031en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/7252
dc.rightsen_US
dc.titleVariability and Reliability in Nanoscale Circuits: Simulation, Design, Monitoring, and Characterization.en_US

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