Variance Reduction in Mean Time to Failure Simulation

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dc.contributor.authorShahabuddin, Perwez
dc.contributor.authorNicola, Victor F.
dc.contributor.authorHeidelberger, Philip
dc.contributor.authorGoyal, Ambuj
dc.contributor.authorGlynn, Peter W.
dc.date.accessioned2012-01-12T18:49:16Z
dc.date.available2012-01-12T18:49:16Z
dc.date.issued1988
dc.format.extent551700 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/6248
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleVariance Reduction in Mean Time to Failure Simulation
dc.typeTechnical report

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