Adaptation of a CMOS Reliability Simulation Model for the Open Model Interface.

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dc.contributor.advisorWilliam Davis, Chair
dc.contributor.advisorYaoyao Jia, Member
dc.contributor.advisorDavid Ricketts, Member
dc.contributor.authorColebaugh, Sarah Kathleen
dc.date.accepted2021-04-22
dc.date.accessioned2021-05-04T14:19:41Z
dc.date.available2021-05-04T14:19:41Z
dc.date.defense2021-03-30
dc.date.issued2021-03-30
dc.date.released2021-05-04
dc.date.reviewed2021-04-05
dc.date.submitted2021-04-01
dc.degree.disciplineElectrical Engineering
dc.degree.levelthesis
dc.degree.nameMaster of Science
dc.identifier.otherdeg24957
dc.identifier.urihttps://www.lib.ncsu.edu/resolver/1840.20/38794
dc.titleAdaptation of a CMOS Reliability Simulation Model for the Open Model Interface.

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