Band offset measurements of the GaN (0001)/HfO2 interface

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dc.date.accessioned2008-03-03T20:39:11Z
dc.date.available2008-03-03T20:39:11Z
dc.date.issued2003
dc.format.extent65579 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationCook, T. E., Fulton, C. C., Mecouch, W. J., Davis, R. F., Lucovsky, G., & Nemanich, R. J. (2003). Band offset measurements of the GaN (0001)/HfO2 interface. Journal of applied physics, 94(11), 7155-7158.
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.2/408
dc.language.isoen
dc.titleBand offset measurements of the GaN (0001)/HfO2 interface
dc.typeArticle

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