The Application of Experimental Design to the Analysis of Semiconductor Manufacturing Lines

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dc.contributor.authorWood, Sarah J.
dc.contributor.authorWelch, Peter D.
dc.date.accessioned2012-01-12T18:49:26Z
dc.date.available2012-01-12T18:49:26Z
dc.date.issued1990
dc.format.extent809338 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/6301
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleThe Application of Experimental Design to the Analysis of Semiconductor Manufacturing Lines
dc.typeTechnical report

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