Empirical Testing of Multiplicative Congruential Generations with Modules 231-1

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dc.contributor.authorFishman, George S.
dc.contributor.authorMoore, Louis R.
dc.date.accessioned2012-01-12T18:45:41Z
dc.date.available2012-01-12T18:45:41Z
dc.date.issued1978
dc.format.extent27115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/5041
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleEmpirical Testing of Multiplicative Congruential Generations with Modules 231-1
dc.typeTechnical report

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