Optical Properties of Si-SiO2 Interfaces by Linear and Nonlinear Optical Techniques
| dc.contributor.advisor | Dr. David E. Aspnes, Chair | en_US |
| dc.contributor.advisor | Dr. Gerald Lucovsky, Member | en_US |
| dc.contributor.advisor | Dr. Robert J. Nemanich, Member | en_US |
| dc.contributor.advisor | Dr. Carlton M. Osburn, Member | en_US |
| dc.contributor.advisor | Dr. John E. Rowe, Member | en_US |
| dc.contributor.author | Wang, Jih-Fu Trevor | en_US |
| dc.date.accessioned | 2010-04-02T18:30:20Z | |
| dc.date.available | 2010-04-02T18:30:20Z | |
| dc.date.issued | 2002-03-05 | en_US |
| dc.degree.discipline | Physics | en_US |
| dc.degree.level | PhD Dissertation | en_US |
| dc.degree.name | PhD | en_US |
| dc.description.abstract | The objective of this research is to understand the physics of (001)Si-SiO data can be realized by the SBHM. From the SHG analysis we find effective angles of incidence and observation of about 12⁰, indicating that the SHG intensity originates at the Si side of the interface. This work further demonstrates the advantages of SBHM for interpreting SHG data with respect to conventional approaches. By expressing nonlinear polarizations in terms of complex hyperpolarizabilities associated with each of bonds in a unit cell, the description is not only much simpler but also provides more physical information and insight that can otherwise be obtained on a microscopic scale. | en_US |
| dc.identifier.other | etd-20020304-114240 | en_US |
| dc.identifier.uri | http://www.lib.ncsu.edu/resolver/1840.16/3465 | |
| dc.rights | I hereby certify that, if appropriate, I have obtained and attached hereto a written permission statement from the owner(s) of each third party copyrighted matter to be included in my thesis, dissertation, or project report, allowing distribution as specified below. I certify that the version I submitted is the same as that approved by my advisory committee. I hereby grant to NC State University or its agents the non-exclusive license to archive and make accessible, under the conditions specified below, my thesis, dissertation, or project report in whole or in part in all forms of media, now or hereafter known. I retain all other ownership rights to the copyright of the thesis, dissertation or project report. I also retain the right to use in future works (such as articles or books) all or part of this thesis, dissertation, or project report. | en_US |
| dc.title | Optical Properties of Si-SiO2 Interfaces by Linear and Nonlinear Optical Techniques | en_US |
Files
Original bundle
1 - 1 of 1
