Scanning Probe Microscopy of Intrinsic and Extrinsic Disorder in Organic Semiconductors.

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dc.contributor.advisorDaniel Dougherty, Chairen_US
dc.contributor.advisorHarald Ade, Memberen_US
dc.contributor.advisorLaura Clarke, Memberen_US
dc.contributor.advisorChristopher Roland, Memberen_US
dc.contributor.advisorCharles Balik, Memberen_US
dc.contributor.authorWang, Jiuyangen_US
dc.date.accepted2014-02-27en_US
dc.date.accessioned2014-02-28T10:30:15Z
dc.date.available2014-02-28T10:30:15Z
dc.date.defense2013-12-03en_US
dc.date.issued2013-12-03en_US
dc.date.released2014-02-28en_US
dc.date.reviewed2013-12-19en_US
dc.date.submitted2013-12-16en_US
dc.degree.disciplinePhysicsen_US
dc.degree.leveldissertationen_US
dc.degree.nameDoctor of Philosophyen_US
dc.identifier.otherdeg3154en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/9226
dc.rightsen_US
dc.titleScanning Probe Microscopy of Intrinsic and Extrinsic Disorder in Organic Semiconductors.en_US

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