Electrical Characterization of Radiation Induced Defects in 3C-SiC.

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dc.contributor.advisorSteven Shannon, Chairen_US
dc.contributor.advisorMohamed Bourham, Memberen_US
dc.contributor.advisorJon-Paul Maria, Minoren_US
dc.contributor.authorCabral, Matthew Johnen_US
dc.date.accepted2013-04-18en_US
dc.date.accessioned2013-04-20T05:30:44Z
dc.date.available2013-04-20T05:30:44Z
dc.date.defense2013-03-25en_US
dc.date.issued2013-03-25en_US
dc.date.released2013-04-20en_US
dc.date.reviewed2013-03-27en_US
dc.date.submitted2013-03-24en_US
dc.degree.disciplineNuclear Engineeringen_US
dc.degree.levelthesisen_US
dc.degree.nameMaster of Scienceen_US
dc.identifier.otherdeg2456en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/8485
dc.rightsen_US
dc.titleElectrical Characterization of Radiation Induced Defects in 3C-SiC.en_US

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