Comparison of Methods for Fitting Data Using Johnson Translation Distributions

dc.contributor.authorStorer, Robert H.
dc.contributor.authorSwain, James J.
dc.contributor.authorVenkatraman, Sekhar
dc.contributor.authorWilson, James R.
dc.date.accessioned2012-01-12T18:54:50Z
dc.date.available2012-01-12T18:54:50Z
dc.date.issued1988
dc.format.extent322698 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/7918
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleComparison of Methods for Fitting Data Using Johnson Translation Distributions
dc.typeTechnical report

Files

Original bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
1988_0069.pdf
Size:
315.13 KB
Format:
Adobe Portable Document Format