Single pass attenuated total reflection fourier transform infrared microscopy apparatus and method for identifying protein secondary structure, surface charge and binding affinity
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2007
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Franzen, S., & Lappi, S. E. (2007). Single pass attenuated total reflection fourier transform infrared microscopy apparatus and method for identifying protein secondary structure, surface charge and binding affinity. U.S. Patent No. 7,255,835. Washington, DC: U.S. Patent and Trademark Office.
