A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid

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dc.contributor.authorLi, Zhilin
dc.contributor.authorZhao, Hongkai
dc.contributor.authorGao, Huajian
dc.date.accessioned2006-11-14T12:46:35Z
dc.date.available2006-11-14T12:46:35Z
dc.date.issued1998
dc.format.extent348770 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.ncsu.edu/crsc/reports/ftp/pdf/crsc-tr98-32.pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/692
dc.language.isoen
dc.publisherNorth Carolina State University. Center for Research in Scientific Computation
dc.relation.ispartofseriesCRSC-TR98-32
dc.relation.ispartofseriesCenter for Research in Scientific Computation Technical Report
dc.titleA numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid
dc.typeTechnical report

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