Uncertainty Quantification for Crystallographic Refinement of Full Profile X-ray Diffraction Patterns with a Bayesian Inference Method.

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dc.contributor.advisorJacob Jones, Chair
dc.contributor.advisorPaul Maggard, Member
dc.contributor.advisorRalph Smith, Member
dc.contributor.advisorNina Wisinger, Member
dc.contributor.advisorRuijuan Xu, Member
dc.contributor.authorBroughton, Rachel Ann
dc.date.accepted2023-07-17
dc.date.accessioned2023-07-19T12:30:31Z
dc.date.available2023-07-19T12:30:31Z
dc.date.defense2023-04-28
dc.date.issued2023-04-28
dc.date.released2023-07-19
dc.date.reviewed2023-05-11
dc.date.submitted2023-05-01
dc.degree.disciplineMaterial Science & Engineering
dc.degree.leveldissertation
dc.degree.nameDoctor of Philosophy
dc.identifier.otherdeg33378
dc.identifier.urihttps://www.lib.ncsu.edu/resolver/1840.20/41133
dc.titleUncertainty Quantification for Crystallographic Refinement of Full Profile X-ray Diffraction Patterns with a Bayesian Inference Method.

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