An Approach to Modeling Labor and Machine Down Time in Semiconductor Fabrication

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dc.contributor.authorBaum, Susan S.
dc.contributor.authorO'Donnell, Cheryl M.
dc.date.accessioned2012-01-12T18:44:39Z
dc.date.available2012-01-12T18:44:39Z
dc.date.issued1991
dc.format.extent879628 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/4658
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleAn Approach to Modeling Labor and Machine Down Time in Semiconductor Fabrication
dc.typeTechnical report

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