Electron-beam-induced optical memory effects in GaN
No Thumbnail Available
Date
2002
Authors
Advisors
Journal Title
Series/Report No.
Journal ISSN
Volume Title
Publisher
Abstract
Description
Keywords
Citation
Chang, Y. C., Cai, A. L., Johnson, M. A. L., Muth, J. F., Kolbas, R. M., Reitmeier, Z. J., Einfeldt, S., & Davis, R. F. (2002). Electron-beam-induced optical memory effects in GaN. Applied physics letters, 80(15), 2675-2677.