Atomic Metrology in Ordered/Disordered Systems Using Scanning Transmission Electron Microscopy.

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dc.contributor.advisorJames LeBeau, Chairen_US
dc.contributor.advisorRonald Scattergood, Memberen_US
dc.contributor.advisorDouglas Irving, Memberen_US
dc.contributor.advisorKorukonda Murty, Memberen_US
dc.contributor.advisorElizabeth Dickey, Memberen_US
dc.contributor.authorOni, Adedapo Adesojien_US
dc.date.accepted2016-02-01en_US
dc.date.accessioned2016-02-03T10:01:57Z
dc.date.available2016-02-03T10:01:57Z
dc.date.defense2015-12-09en_US
dc.date.issued2015-12-09en_US
dc.date.released2016-02-03en_US
dc.date.reviewed2016-01-19en_US
dc.date.submitted2016-01-01en_US
dc.degree.disciplineMaterial Science & Engineeringen_US
dc.degree.leveldissertationen_US
dc.degree.nameDoctor of Philosophyen_US
dc.identifier.otherdeg4896en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/10870
dc.rightsen_US
dc.titleAtomic Metrology in Ordered/Disordered Systems Using Scanning Transmission Electron Microscopy.en_US

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