Depth-dependent Chemical and Structural Profiling of Oxide Thin Films with Scanning Transmission Electron Microscopy.

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dc.contributor.advisorDivine Kumah, Co-Chair
dc.contributor.advisorJames LeBeau, Co-Chair
dc.contributor.advisorElizabeth Dickey, Member
dc.contributor.advisorVeronica Augustyn, Member
dc.contributor.advisorDean Hesterberg, Member
dc.contributor.authorPenn, Aubrey Nance
dc.date.accepted2021-11-03
dc.date.accessioned2021-11-18T13:30:32Z
dc.date.available2021-11-18T13:30:32Z
dc.date.defense2021-09-24
dc.date.issued2021-09-24
dc.date.released2021-11-18
dc.date.reviewed2021-09-28
dc.date.submitted2021-09-24
dc.degree.disciplineMaterial Science & Engineering
dc.degree.leveldissertation
dc.degree.nameDoctor of Philosophy
dc.identifier.otherdeg27000
dc.identifier.urihttps://www.lib.ncsu.edu/resolver/1840.20/39211
dc.titleDepth-dependent Chemical and Structural Profiling of Oxide Thin Films with Scanning Transmission Electron Microscopy.

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