Characterization of the Effect of Radiation Damage on the Thin-Film Stress Behavior of Nanocrystalline 3C SiC.

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dc.contributor.advisorSteven Shannon, Chairen_US
dc.contributor.advisorJon-Paul Maria, Minoren_US
dc.contributor.advisorJacob Eapen, Memberen_US
dc.contributor.authorHardiman, Christopher Men_US
dc.date.accepted2013-07-25en_US
dc.date.accessioned2013-07-30T09:30:10Z
dc.date.available2013-07-30T09:30:10Z
dc.date.defense2013-04-26en_US
dc.date.issued2013-04-26en_US
dc.date.released2013-07-30en_US
dc.date.reviewed2013-05-21en_US
dc.date.submitted2013-05-17en_US
dc.degree.disciplineNuclear Engineeringen_US
dc.degree.levelthesisen_US
dc.degree.nameMaster of Scienceen_US
dc.identifier.otherdeg2683en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/8841
dc.rightsen_US
dc.titleCharacterization of the Effect of Radiation Damage on the Thin-Film Stress Behavior of Nanocrystalline 3C SiC.en_US

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