Master Curve da/dt vs C* for Creep and Creep-Fatigue Crack Growth on CT Specimens

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dc.contributor.authorLaiarinandrasana, Lucien
dc.contributor.authorPiques, Roland
dc.contributor.authorKabiri, Rachid
dc.contributor.authorDrubay, Bernard
dc.date.accessioned2016-10-10T18:48:44Z
dc.date.available2016-10-10T18:48:44Z
dc.date.issued2001-08-12T00:00:00+00:00
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.20/30571
dc.publisherIASMiRT
dc.relation.ispartofseriesF - Design Methods and Rules for Components
dc.relation.ispartofseriesF01 -
dc.relation.ispartofseriesSMiRT 16 - Washington, DC, USA. August 12-17, 2001
dc.titleMaster Curve da/dt vs C* for Creep and Creep-Fatigue Crack Growth on CT Specimens
dc.typeConference Proceeding

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