Characterization of charge-carrier dynamics in thin oxide layers on silicon by second harmonic generation

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dc.date.accessioned2008-02-22T22:25:50Z
dc.date.available2008-02-22T22:25:50Z
dc.date.issued2002
dc.format.extent143314 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationGlinka, Y. D., Wang, W., Singh, S. K., Marka, Z., Rashkeev, S. N., Shirokaya, Y., Albridge, R., Pantelides, S. T., Tolk, N. H., & Lucovsky, G. (2002). Characterization of charge-carrier dynamics in thin oxide layers on silicon by second harmonic generation. Physical review. B, Condensed matter and materials physics, 65(19), 193103-1.
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.2/223
dc.language.isoen
dc.titleCharacterization of charge-carrier dynamics in thin oxide layers on silicon by second harmonic generation
dc.typeArticle

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