Electronic structure of SiO2: Charge redistribution contributions to the dynamic dipoles/effective charges of the infrared active normal modes

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dc.date.accessioned2008-02-22T22:38:08Z
dc.date.available2008-02-22T22:38:08Z
dc.date.issued2002
dc.format.extent124271 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationWhitten, J. L., Zhang, Y., Menon, M., Lucovsky, G. (2002). Electronic structure of SiO2: Charge redistribution contributions to the dynamic dipoles/effective charges of the infrared active normal modes. Journal of vacuum science & technology. B, Microelectronics and nanometer structures, 20(4), 1710-1719.
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.2/232
dc.language.isoen
dc.titleElectronic structure of SiO2: Charge redistribution contributions to the dynamic dipoles/effective charges of the infrared active normal modes
dc.typeArticle

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