Study on Fail-Safe Mechanism in Base-Isolation Device

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dc.contributor.authorT. Nakamura
dc.contributor.authorM. Ohira
dc.contributor.authorS. Higaki
dc.contributor.authorA. Teramura
dc.date.accessioned2016-10-10T18:37:50Z
dc.date.available2016-10-10T18:37:50Z
dc.date.issued1991-08-18T00:00:00+00:00
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.20/23354
dc.publisherIASMiRT
dc.relation.ispartofseriesK - Seismic Response Analysis and Design
dc.relation.ispartofseriesK21 - Seismic Isolation - Design Concepts Co-Chairman
dc.relation.ispartofseriesSMiRT 11 - Tokyo, Japan. August 18-23, 1991
dc.titleStudy on Fail-Safe Mechanism in Base-Isolation Device
dc.typeConference Proceeding

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1991 - SMiRT 11 - Tokyo, Japan