Improved Behavioral Modeling Based on the Input Output Buffer Information Specification.

dc.contributor.advisorPaul D. Franzon, Committee Chairen_US
dc.contributor.advisorMichael B. Steer, Committee Memberen_US
dc.contributor.advisorDoug Barlage, Committee Memberen_US
dc.contributor.advisorAngus Kingon, Committee Memberen_US
dc.contributor.authorVarma, Ambrish Kanten_US
dc.date.accessioned2010-04-02T18:29:46Z
dc.date.available2010-04-02T18:29:46Z
dc.date.issued2007-04-10en_US
dc.degree.disciplineComputer Engineeringen_US
dc.degree.leveldissertationen_US
dc.degree.namePhDen_US
dc.description.abstractHigh level behavioral modeling is widely used in lieu of low level transistor models to ascertain the behavior of I⁄O drivers and receivers. IBIS (Input Output Buffer Information Specification) is one of the most widely used methodology to model digital drivers as it satisfies the basic requirements of a behavioral model such as intellectual property protection, simple structure, fast simulation time and good accuracy. As driver technology gets increasingly complicated and rise time of input signal gets increasingly smaller, important phenomenae such as simultaneous switching noise (SSN) becomes a major consideration when simulating multiple I⁄O drivers in the integrated circuit. Misrepresentation of noise might result in overestimation of signal strength and quality resulting in a high bit error rate and poor signal to noise ratio at the receiver end. This might lead to total failure of the system. With the size of the transistor shrinking, more and more I⁄Os can be accommodated on the chip, resulting in a greater probability of more drivers switching simultaneously, hence increasing the problems of SSN furthermore. Experiments show that IBIS models over-represents noise in the quiet line when placed in an environment where multiple drivers were present and switching simultaneously. A thorough analysis is performed to determine the inadequacies in IBIS with regards to SSN. A method is presented for compensating for the missing information by complimenting the IBIS model with a black box that is simulator independent, without compromising with the speed that IBIS enjoys over the transistor models. Model validation and system level tests are done with the IBIS model in conjunction with the black-box by passing a pseudo random bit sequence (PRBS) at the input. Eye diagrams are used to determine the quality of the received signal at the input for the behavior models as well as transistor models. These tests demonstrated a better response of the behavior model than the plain IBIS model when compared to the circuits with the transistor model. The enhancement of the IBIS models resulted in at least a 20% improvement in the simulation accuracy with behavioral models.en_US
dc.identifier.otheretd-01042007-012012en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/3404
dc.rightsI hereby certify that, if appropriate, I have obtained and attached hereto a written permission statement from the owner(s) of each third party copyrighted matter to be included in my thesis, dis sertation, or project report, allowing distribution as specified below. I certify that the version I submitted is the same as that approved by my advisory committee. I hereby grant to NC State University or its agents the non-exclusive license to archive and make accessible, under the conditions specified below, my thesis, dissertation, or project report in whole or in part in all forms of media, now or hereafter known. I retain all other ownership rights to the copyright of the thesis, dissertation or project report. I also retain the right to use in future works (such as articles or books) all or part of this thesis, dissertation, or project report.en_US
dc.subjectIBISen_US
dc.subjectNoiseen_US
dc.subjectSSNen_US
dc.subjectGate Modulation Effecten_US
dc.subjectBehavioral Modelingen_US
dc.subjectIO Buffersen_US
dc.titleImproved Behavioral Modeling Based on the Input Output Buffer Information Specification.en_US

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