Comparison of Models: Ex Post Facto Validation/Acceptance?

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dc.contributor.authorDiener, David A.
dc.contributor.authorHicks, Heston R.
dc.contributor.authorLong, Lawrence L.
dc.date.accessioned2012-01-12T18:48:58Z
dc.date.available2012-01-12T18:48:58Z
dc.date.issued1992
dc.format.extent1332554 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/6150
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleComparison of Models: Ex Post Facto Validation/Acceptance?
dc.typeTechnical report

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