Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys
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2000
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Lucovsky, G., & Rayner, G. B. (2000). Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys. Applied physics letters, 77(18), 2912-2914.
