Using Resonant Soft X-rays to Reveal Internal Organic Thin Film Structure.

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dc.contributor.advisorHarald Ade, Chairen_US
dc.contributor.advisorMichael Paesler, Memberen_US
dc.contributor.advisorDaniel Dougherty, Memberen_US
dc.contributor.advisorCharles Balik, Memberen_US
dc.contributor.authorGann, Eliot Hughen_US
dc.date.accepted2013-06-28en_US
dc.date.accessioned2013-09-27T09:30:08Z
dc.date.available2013-09-27T09:30:08Z
dc.date.defense2013-06-14en_US
dc.date.embargo2013-09-27en_US
dc.date.issued2013-06-14en_US
dc.date.released2013-09-27en_US
dc.date.reviewed2013-06-25en_US
dc.date.submitted2013-06-14en_US
dc.degree.disciplinePhysicsen_US
dc.degree.leveldissertationen_US
dc.degree.nameDoctor of Philosophyen_US
dc.descriptionNorth Carolina State University Theses Physics.
dc.formatPh.D. North Carolina State University, 2013.
dc.identifier.otherdeg2734en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/8938
dc.rightsen_US
dc.titleUsing Resonant Soft X-rays to Reveal Internal Organic Thin Film Structure.en_US
dcterms.extent1 online resource (xi, 164 pages) : illustrations

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