Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)
| dc.date.accessioned | 2008-03-03T20:41:23Z | |
| dc.date.available | 2008-03-03T20:41:23Z | |
| dc.date.issued | 2003 | |
| dc.format.extent | 308845 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | Cook, T. E., Fulton, C. C., Mecouch, W. J., Tracy, K. M., Davis, R. F., Hurt, E. H., Lucovsky, G., & Nemanich, R. J. (2003). Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001). Journal of applied physics, 93(7), 3995-4004. | |
| dc.identifier.uri | http://www.lib.ncsu.edu/resolver/1840.2/410 | |
| dc.language.iso | en | |
| dc.title | Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001) | |
| dc.type | Article |
