Modeling, Testing, and Fault Masking in CMOS Networks

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dc.contributor.advisorDharma P. Agrawal, Chair
dc.contributor.advisorJ. B. O'Neal, Jr.
dc.contributor.advisorProfessor Chou
dc.contributor.authorAl-Arian, Sami Amin
dc.date.accessioned2023-03-17T18:48:35Z
dc.date.available2023-03-17T18:48:35Z
dc.date.issued1985
dc.degree.disciplineElectrical and Computer Engineering
dc.degree.leveldissertation
dc.degree.nameDoctor of Philosophy
dc.identifier.urihttps://www.lib.ncsu.edu/resolver/1840.20/40725
dc.titleModeling, Testing, and Fault Masking in CMOS Networksen_US
dc.typeThesisen_US

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