Semiconductor Crystal Growth by Vertical Bridgman and Gradient Freezing Processes with Applied Fields

dc.contributor.advisorKara Peters, Committee Memberen_US
dc.contributor.advisorKevin Lyons, Committee Memberen_US
dc.contributor.advisorTarek Echekki, Committee Memberen_US
dc.contributor.advisorNancy Ma, Committee Chairen_US
dc.contributor.authorWang, Xianghongen_US
dc.date.accessioned2010-04-02T18:29:45Z
dc.date.available2010-04-02T18:29:45Z
dc.date.issued2007-05-08en_US
dc.degree.disciplineMechanical Engineeringen_US
dc.degree.leveldissertationen_US
dc.degree.namePhDen_US
dc.description.abstractIntegrated circuits and optoelectronic devices are produced on surfaces of thin wafers sliced from a semiconductor crystal. The performance of the semiconductor is directly related to the uniformity of its composition. The crystal's composition generally changes due to a changing melt composition with segregation coefficient not equal to unity. Therefore, a major objective during the growth of any semiconductor crystal is to minimize the variations of the crystal's dopant or alloy composition. Externally-applied fields such as magnetic and electric fields can be used to provide electromagnetic damping or stirring of the melt motion in order to minimize the dopant or alloy segregation in the melt and thus in the crystal. This research focuses on investigations of various semiconductor crystal growth processes from the melt in the presence of externally-applied fields. These processes are (1) the Bridgman-Stockbarger process in steady magnetic fields, (2) the vertical gradient freezing process using submerged heater growth in steady magnetic and electric fields, (3) the Bridgman process using submerged heater growth in a rotating magnetic field, and (4) the Bridgman process using submerged heater growth in a combination of steady and rotating magnetic fields. Numerical models are developed using a Chebyshev spectral method with Gauss-Lobatto collocation points. These models provide predictions of the temperature, velocity and concentration fields in the melt as well as the dopant or alloy concentration in the entire crystal.en_US
dc.identifier.otheretd-04252006-141628en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/3401
dc.rightsI hereby certify that, if appropriate, I have obtained and attached hereto a written permission statement from the owner(s) of each third party copyrighted matter to be included in my thesis, dissertation, or project report, allowing distribution as specified below. I certify that the version I submitted is the same as that approved by my advisory committee. I hereby grant to NC State University or its agents the non-exclusive license to archive and make accessible, under the conditions specified below, my thesis, dissertation, or project report in whole or in part in all forms of media, now or hereafter known. I retain all other ownership rights to the copyright of the thesis, dissertation or project report. I also retain the right to use in future works (such as articles or books) all or part of this thesis, dissertation, or project report.en_US
dc.subjectSemiconductoren_US
dc.subjectNumerical Modelsen_US
dc.subjectCrystal Growthen_US
dc.subjectMagnetic and Electric Fieldsen_US
dc.subjectChebyshev Spectral Collocation Methodsen_US
dc.titleSemiconductor Crystal Growth by Vertical Bridgman and Gradient Freezing Processes with Applied Fieldsen_US

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