Design of a Full Power Test System for Semiconductor Switching Characterization.

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dc.contributor.advisorDouglas Hopkins, Chair
dc.contributor.advisorWensong Yu, Member
dc.contributor.advisorSubhashish Bhattacharya, Member
dc.contributor.authorMurthy, Pranav Rajashekhara
dc.date.accepted2021-04-13
dc.date.accessioned2021-05-01T12:30:18Z
dc.date.available2021-05-01T12:30:18Z
dc.date.defense2021-01-15
dc.date.issued2021-01-15
dc.date.released2021-05-01
dc.date.reviewed2021-01-20
dc.date.submitted2021-01-18
dc.degree.disciplineElectrical Engineering
dc.degree.levelthesis
dc.degree.nameMaster of Science
dc.identifier.otherdeg24127
dc.identifier.urihttps://www.lib.ncsu.edu/resolver/1840.20/38780
dc.titleDesign of a Full Power Test System for Semiconductor Switching Characterization.

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