Methods for forming and integrated circuit structures containing ruthenium and tungsten containing layers
| dc.date.accessioned | 2008-10-14T17:25:58Z | |
| dc.date.available | 2008-10-14T17:25:58Z | |
| dc.date.issued | 2003 | |
| dc.format.extent | 152962 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | Agarwal, V. K., Derderian, G., Sandhu, G. S., Li, W. M., Visokay, M., Basceri, C., & Yang, S. (2003). Methods for forming and integrated circuit structures containing ruthenium and tungsten containing layers. U.S. Patent No. 6,596,583. Washington, DC: U.S. Patent and Trademark Office. | |
| dc.identifier.uri | http://www.lib.ncsu.edu/resolver/1840.2/1443 | |
| dc.language.iso | en | |
| dc.title | Methods for forming and integrated circuit structures containing ruthenium and tungsten containing layers | |
| dc.type | Patent |
