High-k gate dielectric with uniform nitrogen profile and methods for making the same

dc.date.accessioned2008-10-13T21:32:44Z
dc.date.available2008-10-13T21:32:44Z
dc.date.issued2004
dc.format.extent119795 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationColombo, L., Quevedo-Lopez, M., Chambers, J. J., Visokay, M. R., & Rotondaro, A. L. (2004). High-k gate dielectric with uniform nitrogen profile and methods for making the same. U.S. Patent No. 6,809,370. Washington, DC: U.S. Patent and Trademark Office.
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.2/1323
dc.language.isoen
dc.titleHigh-k gate dielectric with uniform nitrogen profile and methods for making the same
dc.typePatent

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