High Resolution Electron Beam Testing of Gallium Nitride Based Light Emitting Diodes
No Thumbnail Available
Files
Date
2008-04-23
Authors
Journal Title
Series/Report No.
Journal ISSN
Volume Title
Publisher
Abstract
Description
Keywords
GaN, MQW LEDs, STEM, EBIC, CL, V-defects
Citation
Degree
PhD
Discipline
Materials Science and Engineering
