The Generation of Confidence Intervals for Steady State Simulations Through the Application of Spectral Analysis

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dc.contributor.authorWelch, Peter D.
dc.date.accessioned2012-01-12T18:54:30Z
dc.date.available2012-01-12T18:54:30Z
dc.date.issued1983
dc.format.extent30445 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/7825
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleThe Generation of Confidence Intervals for Steady State Simulations Through the Application of Spectral Analysis
dc.typeTechnical report

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