Band offset measurements of the Si3N4/GaN (0001) interface
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2003
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Cook, T. E., Fulton, C. C., Mecouch, W. J., Davis, R. F., Lucovsky, G., & Nemanich, R. J. (2003). Band offset measurements of the Si3N4/GaN (0001) interface. Journal of applied physics, 94(6), 3949-3954.
