Issues in Using a DIS Facility in Analysis

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dc.contributor.authorKloeber, Jack M., Jr.
dc.contributor.authorJackson, Jack A., Jr.
dc.date.accessioned2012-01-12T18:47:55Z
dc.date.available2012-01-12T18:47:55Z
dc.date.issued1995
dc.format.extent1739838 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.4/5817
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesWinter Simulation Conference Proceedings
dc.titleIssues in Using a DIS Facility in Analysis
dc.typeTechnical report

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