Spectroscopic characterization of high k dielectrics: Applications to interface electronic structure and stability against chemical phase separation
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2004
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Krug, C., & Lucovsky, G. (2004). Spectroscopic characterization of high k dielectrics: Applications to interface electronic structure and stability against chemical phase separation. Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 22(4), 1301-1308.
