Interfacial Slippage and Fricion Studies on Material of Interest to Microelectromechanical Systems (MEMS)

dc.contributor.advisorJacqueline Krim, Committee Chairen_US
dc.contributor.advisorDave Aspnes, Committee Memberen_US
dc.contributor.advisorHans Hallen, Committee Memberen_US
dc.contributor.advisorArkady Kheyfets, Committee Memberen_US
dc.contributor.authorNeeyakorn, Worakarnen_US
dc.date.accessioned2010-04-02T19:16:29Z
dc.date.available2010-04-02T19:16:29Z
dc.date.issued2006-11-20en_US
dc.degree.disciplinePhysicsen_US
dc.degree.leveldissertationen_US
dc.degree.namePhDen_US
dc.description.abstractI have studied the water vapor adsorption onto quartz crystal microbalance crystals in different type of gas surrounding. The noble gas alone has no charge and therefore can not have a Coulomb interaction with the water molecules, only van der Waals interactions. However, the study reveals how dissolved gas increases the hydrophobicity of water, which has the impact on the slip time and sliding friction of water film. This effect strongly influences the slippage of water film. I also performed a quartz crystal microbalance (QCM) study of the nanotribological properties of organo-phosphate (tricresylphosphate and t-butyl phenylphosphate) layers adsorbed from the vapor phase onto silicon (amorphous silicon and MEMS-like polysilicon), and octadecyltrichlorosilane (OTS) treated silicon and gold surfaces. The latter systems have been studied in order to explore whether organophosphates and OTS in combination might prove synergistic from a tribological point of view. There is a strong possibility that this combination will also exhibit synergistic tribological behaviors when tested on actual MEMS devices. Therefore, it is important to perform QCM measurement on silicon that is as close to that of MEMS devices. In order to perform this study, we have developed a deposition method involving a Si-Ge layer that enables the growth of polycrystalline silicon on top of Cu QCM electrodes. The structural and morphological properties of these samples have been characterized with Raman spectroscopy and atomic force microscopy (AFM), confirming that they are similar in nature to the silicon in actual MEMS devices.en_US
dc.identifier.otheretd-05192006-043130en_US
dc.identifier.urihttp://www.lib.ncsu.edu/resolver/1840.16/5603
dc.rightsI hereby certify that, if appropriate, I have obtained and attached hereto a written permission statement from the owner(s) of each third party copyrighted matter to be included in my thesis, dissertation, or project report, allowing distribution as specified below. I certify that the version I submitted is the same as that approved by my advisory committee. I hereby grant to NC State University or its agents the non-exclusive license to archive and make accessible, under the conditions specified below, my thesis, dissertation, or project report in whole or in part in all forms of media, now or hereafter known. I retain all other ownership rights to the copyright of the thesis, dissertation or project report. I also retain the right to use in future works (such as articles or books) all or part of this thesis, dissertation, or project report.en_US
dc.subjectNanotribologyen_US
dc.subjectNo Slip Boundary Conditionen_US
dc.subjectLubricationen_US
dc.subjectVapor Phase Lubricanten_US
dc.subjectMEMSen_US
dc.subjectQCMen_US
dc.titleInterfacial Slippage and Fricion Studies on Material of Interest to Microelectromechanical Systems (MEMS)en_US

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