Statistics for Deposition and Electrical, Chemical and Microstructural Characterization of the Interface Formed between Pt, Au and Ag Rectifying Contacts and Cleaned n-type GaN (0001) Surfaces.
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| Deposition and Electrical, Chemical and Microstructural Characterization of the Interface Formed between Pt, Au and Ag Rectifying Contacts and Cleaned n-type GaN (0001) Surfaces. | 1 |
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