Statistics for Investigation of ALD Dielectrics for Improved Threshold Voltage Stability and Current Collapse Suppression in AlGaN/GaN MOS-HFETs.
Total visits
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| Investigation of ALD Dielectrics for Improved Threshold Voltage Stability and Current Collapse Suppression in AlGaN/GaN MOS-HFETs. | 16 |
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| January 2026 | 0 |
| February 2026 | 0 |
| March 2026 | 0 |
| April 2026 | 5 |
| May 2026 | 0 |
| June 2026 | 0 |
| July 2026 | 0 |
File Visits
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| etd.pdf | 321 |
