Statistics for Spectroscopic Studies of Semiconductor Materials for Aggressive-scaled Micro- and Opto-electronic Devices: nc-SiO2, GeO2; ng-Si, Ge and ng-Transition metal (TM) oxides.
Total visits
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| Spectroscopic Studies of Semiconductor Materials for Aggressive-scaled Micro- and Opto-electronic Devices: nc-SiO2, GeO2; ng-Si, Ge and ng-Transition metal (TM) oxides. | 2 |
Total visits per month
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| June 2025 | 0 |
| July 2025 | 0 |
| August 2025 | 0 |
| September 2025 | 0 |
| October 2025 | 2 |
| November 2025 | 0 |
| December 2025 | 0 |
File Visits
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| etd.pdf | 48 |
