Statistics for Heavy-ion-induced breakdown in ultra-thin gate oxides and high- k dielectrics
Total visits
| views | |
|---|---|
| Heavy-ion-induced breakdown in ultra-thin gate oxides and high- k dielectrics | 0 |
Total visits per month
| views | |
|---|---|
| October 2024 | 0 |
| November 2024 | 0 |
| December 2024 | 0 |
| January 2025 | 0 |
| February 2025 | 0 |
| March 2025 | 0 |
| April 2025 | 0 |
File Visits
| views | |
|---|---|
| lucovsky_2001_ieee_trans_nucl_sci_1904.pdf | 56 |
