Statistics for Soft x-ray photoelectron spectroscopy of (HfO2)(x)(SiO2)(1-x) high-k gate-dielectric structures
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| Soft x-ray photoelectron spectroscopy of (HfO2)(x)(SiO2)(1-x) high-k gate-dielectric structures | 2 |
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| Lucovsky_2003_Journal_Vac_Sci_Tech_B_1777.pdf | 118 |
