Statistics for Comparison of ultrathin SiO2/Si(100) and SiO2/Si(111) interfaces from soft x-ray photoelectron spectroscopy
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| Comparison of ultrathin SiO2/Si(100) and SiO2/Si(111) interfaces from soft x-ray photoelectron spectroscopy | 2 |
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| Lucovsky_Journal_Vac_Sci_Tech_B_2132.pdf | 68 |
