Statistics for Electron trapping in metal-insulator-semiconductor structures on n-GaN with SiO2 and Si3N4 dielectrics
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| Electron trapping in metal-insulator-semiconductor structures on n-GaN with SiO2 and Si3N4 dielectrics | 1 |
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| August 2025 | 0 |
| September 2025 | 0 |
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| lucovsky_2004_journal_vacuum_science_tech_A_2379.pdf | 96 |
